The structural characterization technique described in the passage provides information about

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Nickel (II) oxide (NiO) is often deposited as a thin film onto glass substrates through spray pyrolysis. The electrical properties of the NiO film were characterized experimentally. The electrical resistivity was recorded within the approximate 30°C to 170°C range (Figure 1). In addition, the activation energy of conductivity was determined by plotting the natural log of the DC conductivity as a function of 1000/T (Figure 2). The NiO film was also, importantly, characterized structurally using X-ray diffraction.



The structural characterization technique described in the passage provides information about